DSpace at KISTKIST Patent2000

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dc.contributor.author김재진-
dc.contributor.author전명석-
dc.contributor.author이상엽-
dc.date.accessioned2024-01-12T11:05:48Z-
dc.date.available2024-01-12T11:05:48Z-
dc.date.issued2002-10-15-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/85265-
dc.title막여과　시간에　따른　막오염　진행　추이를　동시에　연속적으로　모니터링하기위한　막여과　장치　및　방법-
dc.typePatent-
dc.date.registration2002-10-15-
dc.date.application2000-10-04-
dc.identifier.patentRegistrationNumber6,463,790-
dc.identifier.patentApplicationNumber09/678,829-
dc.publisher.countryUS-
dc.type.iprs특허-
dc.contributor.assignee한국과학기술연구원-
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KIST Patent > 2000
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