DSpace at KISTKIST Patent2020

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dc.contributor.author황준연-
dc.contributor.author이경은-
dc.contributor.author이정오-
dc.contributor.author강민성-
dc.contributor.author정두원-
dc.contributor.author장아랑-
dc.contributor.author이건희-
dc.date.accessioned2024-01-12T11:31:05Z-
dc.date.available2024-01-12T11:31:05Z-
dc.date.issued2022-03-07-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/85613-
dc.title전도성 기재 및 이를 이용한 분석대상물의 분석방법-
dc.typePatent-
dc.date.registration2022-03-07-
dc.date.application2020-06-18-
dc.identifier.patentRegistrationNumber10-2373061-
dc.identifier.patentApplicationNumber10-2020-0073970-
dc.publisher.countryKO-
dc.type.iprs특허-
dc.contributor.assignee한국과학기술연구원-
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KIST Patent > 2020
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