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dc.contributor.authorLee, Seok-
dc.date.accessioned2024-01-12T11:40:09Z-
dc.date.available2024-01-12T11:40:09Z-
dc.date.created2022-01-14-
dc.date.issued1995-10-04-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/85977-
dc.titleCarrier lifetime in Dielectric Cap Disordered GaAs/AlGaAs Quantum Well by SiN-
dc.typeConference-
dc.description.journalClass1-
dc.identifier.bibliographicCitation, pp.67 - 0-
dc.citation.startPage67-
dc.citation.endPage0-
dc.relation.isPartOfCLEO/QELS'95, Baltimore, USA-
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