Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, Young jun | - |
| dc.date.accessioned | 2024-01-12T11:44:01Z | - |
| dc.date.available | 2024-01-12T11:44:01Z | - |
| dc.date.created | 2022-01-14 | - |
| dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/86147 | - |
| dc.publisher | WORLDCOMP | - |
| dc.title | Volume data inspection tools for industrial computed tomography | - |
| dc.type | Conference | - |
| dc.description.journalClass | 1 | - |
| dc.identifier.bibliographicCitation | WORLDCOMP'09 | - |
| dc.citation.title | WORLDCOMP'09 | - |
| dc.citation.conferencePlace | US | - |
| dc.relation.isPartOf | WORLDCOMP'09 | - |
- Appears in Collections:
- KIST Conference Paper > Others
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