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dc.contributor.authorLEE, JI YEONG-
dc.contributor.authorJang Yun Jung-
dc.contributor.author송재봉-
dc.contributor.authorYanghee, Kim-
dc.contributor.authorLEE, YEON HEE-
dc.contributor.authorAhn, Jae Pyoung-
dc.date.accessioned2024-01-12T12:10:25Z-
dc.date.available2024-01-12T12:10:25Z-
dc.date.created2021-09-29-
dc.identifier.issn--
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/86573-
dc.publisher2015.10.6~8. 변산-
dc.title.alternativeAtom Probe를 이용한 정량 분석의 신뢰성 연구-
dc.typeConference-
dc.description.journalClass2-
dc.identifier.bibliographicCitation표면분석 심포지움-
dc.citation.title표면분석 심포지움-
dc.citation.conferencePlaceKO-
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