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dc.contributor.authorBae, Jee Hwan-
dc.contributor.authorMin Kyung Cho-
dc.contributor.authorLee Pyeong-Koo-
dc.contributor.authorCho Hye Young-
dc.contributor.authorHye Jung Chang-
dc.date.accessioned2024-01-12T12:12:24Z-
dc.date.available2024-01-12T12:12:24Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/86662-
dc.languageEnglish-
dc.publisher9.9~14, 시드니, 오스트레일리아-
dc.titleSingle Dust Particle Analysis to Trace the Origin-
dc.typeConference-
dc.description.journalClass1-
dc.identifier.bibliographicCitation19th International Microscopy Congress (IMC19)-
dc.citation.title19th International Microscopy Congress (IMC19)-
dc.citation.conferencePlaceAT-
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