Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim Ji-Young | - |
| dc.contributor.author | Park. Jaeho | - |
| dc.contributor.author | Chung, Kyung Yoon | - |
| dc.contributor.author | Chun Dong Won | - |
| dc.date.accessioned | 2024-01-12T12:13:19Z | - |
| dc.date.available | 2024-01-12T12:13:19Z | - |
| dc.date.created | 2021-09-29 | - |
| dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/86702 | - |
| dc.language | English | - |
| dc.publisher | 9.9~14, 시드니, 오스트레일리아 | - |
| dc.title | The electrical characterization of battery materials with EBIC (Electron beam induced current)/RCI (Resistive contrast image) analysis | - |
| dc.type | Conference | - |
| dc.description.journalClass | 1 | - |
| dc.identifier.bibliographicCitation | 19th International Microscopy Congress (IMC19) | - |
| dc.citation.title | 19th International Microscopy Congress (IMC19) | - |
| dc.citation.conferencePlace | AT | - |
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