DSpace at KISTKIST Patent2008

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dc.contributor.author정지현-
dc.contributor.author이정학-
dc.contributor.author김세윤-
dc.date.accessioned2024-01-12T12:36:28Z-
dc.date.available2024-01-12T12:36:28Z-
dc.date.issued2010-10-04-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/86991-
dc.title개방단말 동축선 프로브를 이용한 매질의 전기적 특성 측정 장치-
dc.typePatent-
dc.date.registration2010-10-04-
dc.date.application2008-07-30-
dc.identifier.patentRegistrationNumber0986641-
dc.identifier.patentApplicationNumber2008-0074815-
dc.publisher.countryKO-
dc.type.iprs특허-
dc.contributor.assignee한국과학기술연구원-
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KIST Patent > 2008
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