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dc.contributor.authorDae-Young Jeon-
dc.contributor.authorDong Su Lee-
dc.contributor.authorSeoung-Ki Lee-
dc.contributor.authorMin Park-
dc.contributor.authorSo Jeong Park-
dc.contributor.authorGyu-Tae kim-
dc.date.accessioned2024-01-12T12:42:10Z-
dc.date.available2024-01-12T12:42:10Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/87212-
dc.languageEnglish-
dc.publisher6.17~22, 프랑스-
dc.subjectTMDs-
dc.subjectPartially depleted-
dc.subjectBulk neutral mobility-
dc.subjectSeries resistance-
dc.titleElectrical Characterization of Partially Depleted MoS2 Field-Effect Transistors-
dc.typeConference-
dc.description.journalClass1-
dc.identifier.bibliographicCitationEuropean Materials Research Society (E-MRS)-
dc.citation.titleEuropean Materials Research Society (E-MRS)-
dc.citation.conferencePlaceFR-
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