DSpace at KIST: Realization of selective N02 detection with exceptionally high sensitivity using defect-induced single-walled carbon nanotubes with simultaneous Pt functionalization

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DC Field	Value	Language
dc.contributor.author	최선우	-
dc.contributor.author	JaeseongKim	-
dc.contributor.author	Byun, Young Tae	-
dc.date.accessioned	2024-01-12T13:42:27Z	-
dc.date.available	2024-01-12T13:42:27Z	-
dc.date.created	2021-09-29	-
dc.identifier.uri	https://pubs.kist.re.kr/handle/201004/88357	-
dc.language	English	-
dc.publisher	9.25~29, 프랑스	-
dc.subject	SWCNT	-
dc.subject	High selectivity	-
dc.subject	defect	-
dc.subject	platium	-
dc.title	Realization of selective N02 detection with exceptionally high sensitivity using defect-induced single-walled carbon nanotubes with simultaneous Pt functionalization	-
dc.type	Conference	-
dc.description.journalClass	1	-
dc.identifier.bibliographicCitation	Extended Defects in Semiconductors (EDS 2016), pp.36	-
dc.citation.title	Extended Defects in Semiconductors (EDS 2016)	-
dc.citation.startPage	36	-
dc.citation.endPage	36	-
dc.citation.conferencePlace	FR	-

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