DSpace at KISTKIST Patent2017

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dc.contributor.author박태언-
dc.contributor.author김형준-
dc.contributor.author민병철-
dc.contributor.author한석희-
dc.contributor.author장준연-
dc.contributor.author구현철-
dc.date.accessioned2024-01-12T14:30:18Z-
dc.date.available2024-01-12T14:30:18Z-
dc.date.issued2018-09-28-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/89010-
dc.title나노자성체의 자기구조 및 자기특성 측정방법-
dc.typePatent-
dc.date.registration2018-09-28-
dc.date.application2017-08-03-
dc.identifier.patentRegistrationNumber1905069-
dc.identifier.patentApplicationNumber2017-0098606-
dc.publisher.countryKO-
dc.type.iprs특허-
dc.contributor.assignee한국과학기술연구원-
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KIST Patent > 2017
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