Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 최재빈 | - |
dc.contributor.author | 전영민 | - |
dc.contributor.author | 우덕하 | - |
dc.contributor.author | 이석 | - |
dc.contributor.author | 김철기 | - |
dc.contributor.author | 이택진 | - |
dc.contributor.author | 서민아 | - |
dc.contributor.author | 유용상 | - |
dc.contributor.author | 김재헌 | - |
dc.date.accessioned | 2024-01-12T14:30:59Z | - |
dc.date.available | 2024-01-12T14:30:59Z | - |
dc.date.issued | 2018-07-10 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/89068 | - |
dc.title | 지렛대 원리를 이용한 입자크기 감지방법 및 장치 | - |
dc.type | Patent | - |
dc.date.registration | 2018-07-10 | - |
dc.date.application | 2016-11-28 | - |
dc.identifier.patentRegistrationNumber | 10-1878699 | - |
dc.identifier.patentApplicationNumber | 2016-0159111 | - |
dc.publisher.country | KO | - |
dc.type.iprs | 특허 | - |
dc.contributor.assignee | 한국과학기술연구원 | - |
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