DSpace at KISTKIST Patent2016

Full metadata record

DC Field Value Language
dc.contributor.author정경윤-
dc.contributor.author김동현-
dc.contributor.author디키 수산토-
dc.contributor.author노재교-
dc.contributor.author조병원-
dc.contributor.author박재호-
dc.contributor.author정훈기-
dc.contributor.author장원영-
dc.contributor.author김수진-
dc.date.accessioned2024-01-12T14:31:42Z-
dc.date.available2024-01-12T14:31:42Z-
dc.date.issued2017-10-27-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/89128-
dc.title투과형 엑스선 회절 분석시스템용 시료 지지장치 및 이를 이용한 투과형 엑스선 회절 분석시스템-
dc.typePatent-
dc.date.registration2017-10-27-
dc.date.application2016-04-05-
dc.identifier.patentRegistrationNumber10-1793250-
dc.identifier.patentApplicationNumber2016-0041693-
dc.publisher.countryKO-
dc.type.iprs특허-
dc.contributor.assignee한국과학기술연구원-
Appears in Collections:
KIST Patent > 2016
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML
Show Simple Item Record

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE