DSpace at KISTKIST Patent2014

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dc.contributor.author김유미-
dc.contributor.author김광열-
dc.contributor.author김상우-
dc.contributor.author김진영-
dc.date.accessioned2024-01-12T14:33:08Z-
dc.date.available2024-01-12T14:33:08Z-
dc.date.issued2016-08-16-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/89244-
dc.titleCSEOF의 멀티 기준을 이용한 세분화된 입자 생성 및 성장 현상 판독 방법-
dc.typePatent-
dc.date.registration2016-08-16-
dc.date.application2014-12-12-
dc.identifier.patentRegistrationNumber10-1649993-
dc.identifier.patentApplicationNumber2014-0179593-
dc.publisher.countryKO-
dc.type.iprs특허-
dc.contributor.assignee한국과학기술연구원-
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KIST Patent > 2014
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