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전자현미경을 이용한 중금속 미세먼지 단일 입자의 상분석 및 발생원 추적

Authors

Cho hye young; Lee Pyeong Gu; Hye Jung Chang

Citation

한국현미경학회

Keywords

Single particle analysis; Heavy metal contamination; Micro-dust; Electron microscope; Super-X EDS

URI

https://pubs.kist.re.kr/handle/201004/89558

Appears in Collections:

KIST Conference Paper > Others

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