DSpace at KISTKIST Patent2006

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dc.contributor.author문성욱-
dc.contributor.author이승훈-
dc.contributor.author추성일-
dc.contributor.author김진혁-
dc.date.accessioned2024-01-12T15:31:54Z-
dc.date.available2024-01-12T15:31:54Z-
dc.date.issued2008-08-08-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/90248-
dc.title반도체 검사용 수직형 프로브 및 이 프로브를 구비한 프로브 카드 및 그 제조방법-
dc.typePatent-
dc.date.registration2008-08-08-
dc.date.application2006-07-31-
dc.identifier.patentRegistrationNumber10-0852514-
dc.identifier.patentApplicationNumber2006-72402-
dc.publisher.countryKO-
dc.type.iprs특허-
dc.contributor.assignee한국과학기술연구원-
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KIST Patent > 2006
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