Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 정지형 | - |
dc.contributor.author | 이재성 | - |
dc.date.accessioned | 2024-01-12T16:00:24Z | - |
dc.date.available | 2024-01-12T16:00:24Z | - |
dc.date.issued | 2004-12-06 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/90718 | - |
dc.title | 고농도 COD 측정용 키트 및 측정방법 | - |
dc.type | Patent | - |
dc.date.registration | 2004-12-06 | - |
dc.date.application | 2002-03-29 | - |
dc.identifier.patentRegistrationNumber | 0461964 | - |
dc.identifier.patentApplicationNumber | 2002-0017520 | - |
dc.publisher.country | KO | - |
dc.type.iprs | 특허 | - |
dc.contributor.assignee | 한국과학기술연구원 | - |
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