DSpace at KISTKIST Patent2018

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dc.contributor.author이연희-
dc.contributor.author탕기위테리어-
dc.contributor.author남윤식-
dc.contributor.author이지혜-
dc.contributor.author이강봉-
dc.date.accessioned2024-01-12T17:00:29Z-
dc.date.available2024-01-12T17:00:29Z-
dc.date.issued2020-04-09-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/91859-
dc.title비행시간형 이차이온 질량분석기 (ToF-SIMS) 및 주성분 분석 (PCA) 기술을 이용한 화장품 흔적증거물 감식 기술 개발-
dc.typePatent-
dc.date.registration2020-04-09-
dc.date.application2018-09-07-
dc.identifier.patentRegistrationNumber10-2101484-
dc.identifier.patentApplicationNumber10-2018-0107199-
dc.publisher.countryKO-
dc.type.iprs특허-
dc.contributor.assignee한국과학기술연구원-
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KIST Patent > 2018
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