DSpace at KISTKIST Patent2018

Full metadata record

DC Field Value Language
dc.contributor.author곽기성-
dc.contributor.author박민철-
dc.date.accessioned2024-01-12T17:00:35Z-
dc.date.available2024-01-12T17:00:35Z-
dc.date.issued2019-10-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/91867-
dc.title비접촉식 샘플 높이 측정 시스템-
dc.typePatent-
dc.date.registration2019-10-29-
dc.date.application2018-08-08-
dc.identifier.patentRegistrationNumber10-2040017-
dc.identifier.patentApplicationNumber2018-0092168-
dc.publisher.countryKO-
dc.type.iprs특허-
dc.contributor.assignee한국과학기술연구원-
Appears in Collections:
KIST Patent > 2018
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML
Show Simple Item Record

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE