카메라 측정 시스템 및 이를 이용한 측정 방법

Author
안상철황재인김익재고희동
Assignee
한국과학기술연구원
Regitration Date
2012-09-21
Registration No.
1186470
Application Date
2010-02-11
Application No.
2010-0012937
Country
KO
URI
https://pubs.kist.re.kr/handle/201004/92986
Appears in Collections:
KIST Patent > 2010
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