Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | LEE, YEON HEE | - |
| dc.contributor.author | Lee Ji-hye | - |
| dc.contributor.author | 김선희 | - |
| dc.contributor.author | Jang Yun Jung | - |
| dc.date.accessioned | 2024-01-12T18:03:59Z | - |
| dc.date.available | 2024-01-12T18:03:59Z | - |
| dc.date.created | 2021-09-29 | - |
| dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/93273 | - |
| dc.language | English | - |
| dc.title | Comparison of Quantitative Analysis for Photocoltaic CIGS Thin Films by SIMS Depth Profiling with Element Ions and MCs+ Clusters | - |
| dc.type | Conference | - |
| dc.description.journalClass | 1 | - |
| dc.identifier.bibliographicCitation | European Conference on Applications of Surface and Interface Analysis | - |
| dc.citation.title | European Conference on Applications of Surface and Interface Analysis | - |
| dc.citation.conferencePlace | IT | - |
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