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Surface Analysis of Diblock Copolymer Films by TOF-SIMS in Combination with AFM

Authors

Lee Ji-hye; 김선희; 강희경; LEE, KANG BONG; LEE, YEON HEE

Citation

International Conference on Secondary Ion Mass Spectrometry

URI

https://pubs.kist.re.kr/handle/201004/93279

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KIST Conference Paper > Others

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