Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 김선희 | - |
dc.contributor.author | LIM, WEON CHEOL | - |
dc.contributor.author | LEE, YEON HEE | - |
dc.date.accessioned | 2024-01-12T19:34:43Z | - |
dc.date.available | 2024-01-12T19:34:43Z | - |
dc.date.created | 2021-09-29 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/95000 | - |
dc.subject | CIGS | - |
dc.subject | TOF-SIMS | - |
dc.subject | 정량 분석 | - |
dc.subject | 태양전지 | - |
dc.subject | cluster ion | - |
dc.title.alternative | TOF-SIMS를 이용한 CIGS 정량분석 | - |
dc.type | Conference | - |
dc.description.journalClass | 2 | - |
dc.identifier.bibliographicCitation | 표면분석 심포지움 | - |
dc.citation.title | 표면분석 심포지움 | - |
dc.citation.conferencePlace | KO | - |
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