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Aptamer sensor by using total internal reflection ellipsometry

Authors

Jung Yong Woo; Woo, Deok Ha; KIM, JAE HUN; Tae Jung Kim; Young Dong Kim

Citation

한국바이오칩학회 춘계학술발표대회, pp.173

Keywords

Aptamer; sensor; total internal reflection; ellipsometry

URI

https://pubs.kist.re.kr/handle/201004/95786

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KIST Conference Paper > Others

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