DSpace at KISTKIST Patent2020

Full metadata record

DC Field Value Language
dc.contributor.author유용상-
dc.contributor.author유의상-
dc.contributor.author이종수-
dc.contributor.author박유신-
dc.contributor.author서민아-
dc.contributor.author김철기-
dc.contributor.author김재헌-
dc.contributor.author이택진-
dc.contributor.author전명석-
dc.contributor.author전영민-
dc.contributor.author변영태-
dc.contributor.author이석-
dc.contributor.author우덕하-
dc.contributor.author송현석-
dc.date.accessioned2024-01-12T21:33:43Z-
dc.date.available2024-01-12T21:33:43Z-
dc.date.issued2022-02-09-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/97192-
dc.title고온발생 입자 감지 장치-
dc.typePatent-
dc.date.registration2022-02-09-
dc.date.application2020-08-03-
dc.identifier.patentRegistrationNumber10-2362856-0000-
dc.identifier.patentApplicationNumber10-2020-0096819-
dc.publisher.countryKO-
dc.type.iprs특허-
dc.contributor.assignee한국과학기술연구원-
Appears in Collections:
KIST Patent > 2020
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML
Show Simple Item Record

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE