Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lee Ji-hye | - |
dc.contributor.author | Min Hwa Kang | - |
dc.contributor.author | LIM, WEON CHEOL | - |
dc.contributor.author | Kwanwoo Shin | - |
dc.contributor.author | LEE, YEON HEE | - |
dc.date.accessioned | 2024-01-12T21:36:05Z | - |
dc.date.available | 2024-01-12T21:36:05Z | - |
dc.date.created | 2021-09-29 | - |
dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/97346 | - |
dc.language | English | - |
dc.subject | sims depth profiling | - |
dc.subject | diblock copolymer | - |
dc.subject | ps | - |
dc.subject | pprma | - |
dc.subject | peha | - |
dc.title | Characterization of microphase-separated diblock copolymer films by TOF-SIMS | - |
dc.type | Conference | - |
dc.description.journalClass | 1 | - |
dc.identifier.bibliographicCitation | SIMS XVIII, pp.137 | - |
dc.citation.title | SIMS XVIII | - |
dc.citation.startPage | 137 | - |
dc.citation.conferencePlace | IT | - |
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