Full metadata record

DC Field Value Language
dc.contributor.authorLee Ji-hye-
dc.contributor.authorMin Hwa Kang-
dc.contributor.authorLIM, WEON CHEOL-
dc.contributor.authorKwanwoo Shin-
dc.contributor.authorLEE, YEON HEE-
dc.date.accessioned2024-01-12T21:36:05Z-
dc.date.available2024-01-12T21:36:05Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/97346-
dc.languageEnglish-
dc.subjectsims depth profiling-
dc.subjectdiblock copolymer-
dc.subjectps-
dc.subjectpprma-
dc.subjectpeha-
dc.titleCharacterization of microphase-separated diblock copolymer films by TOF-SIMS-
dc.typeConference-
dc.description.journalClass1-
dc.identifier.bibliographicCitationSIMS XVIII, pp.137-
dc.citation.titleSIMS XVIII-
dc.citation.startPage137-
dc.citation.conferencePlaceIT-
Appears in Collections:
KIST Conference Paper > Others
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE