DSpace at KISTKIST Patent2018

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dc.contributor.author전대영-
dc.contributor.author이승기-
dc.contributor.author김태욱-
dc.contributor.author이동수-
dc.contributor.author김남동-
dc.date.accessioned2024-01-12T22:01:40Z-
dc.date.available2024-01-12T22:01:40Z-
dc.date.issued2020-04-01-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/97613-
dc.title반도체 재료의 도핑농도 측정방법 및 이를 이용한 컴퓨터 프로그램을 기록한 기록매체-
dc.typePatent-
dc.date.registration2020-04-01-
dc.date.application2018-08-31-
dc.identifier.patentRegistrationNumber10-2098288-
dc.identifier.patentApplicationNumber10-2018-0103697-
dc.publisher.countryKO-
dc.type.iprs특허-
dc.contributor.assignee한국과학기술연구원-
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KIST Patent > 2018
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