DSpace at KISTKIST Patent2017

Full metadata record

DC Field Value Language
dc.contributor.author박승영-
dc.contributor.author민병철-
dc.contributor.author김상일-
dc.contributor.author조영훈-
dc.date.accessioned2024-01-12T22:02:43Z-
dc.date.available2024-01-12T22:02:43Z-
dc.date.issued2018-12-10-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/97689-
dc.title웨이퍼 검사장치-
dc.typePatent-
dc.date.registration2018-12-10-
dc.date.application2017-06-15-
dc.identifier.patentRegistrationNumber10-1929240-
dc.identifier.patentApplicationNumber2017-0075927-
dc.publisher.countryKO-
dc.type.iprs특허-
dc.contributor.assignee한국과학기술연구원-
Appears in Collections:
KIST Patent > 2017
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML
Show Simple Item Record

qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE