Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Park ki ho | - |
| dc.contributor.author | Choi Jun Young | - |
| dc.contributor.author | Byeong-Kwon Ju | - |
| dc.contributor.author | Lee Sang Yeol | - |
| dc.date.accessioned | 2024-01-12T22:06:44Z | - |
| dc.date.available | 2024-01-12T22:06:44Z | - |
| dc.date.created | 2021-09-29 | - |
| dc.identifier.uri | https://pubs.kist.re.kr/handle/201004/97962 | - |
| dc.language | English | - |
| dc.title | Threshold voltage instability in solution-processed silicon-zinc-tin-oxide thin film transistors | - |
| dc.type | Conference | - |
| dc.description.journalClass | 1 | - |
| dc.identifier.bibliographicCitation | 7th International Symposium on Transparent Oxide Thin Films for Electronics and Optics | - |
| dc.citation.title | 7th International Symposium on Transparent Oxide Thin Films for Electronics and Optics | - |
| dc.citation.conferencePlace | JA | - |
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