DSpace at KIST: A Quantitative Analysis for CIGS Thin Films by Dynamic Secondary Ion Mass Spectrometry

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DC Field	Value	Language
dc.contributor.author	LIM, WEON CHEOL	-
dc.contributor.author	Lee Ji-hye	-
dc.contributor.author	Won, Sung Ok	-
dc.contributor.author	LEE, YEON HEE	-
dc.date.accessioned	2024-01-12T22:07:11Z	-
dc.date.available	2024-01-12T22:07:11Z	-
dc.date.created	2021-09-29	-
dc.identifier.uri	https://pubs.kist.re.kr/handle/201004/97995	-
dc.language	English	-
dc.subject	Quantitative	-
dc.subject	CIGS	-
dc.subject	SIMS	-
dc.subject	XRF	-
dc.title	A Quantitative Analysis for CIGS Thin Films by Dynamic Secondary Ion Mass Spectrometry	-
dc.type	Conference	-
dc.description.journalClass	2	-
dc.identifier.bibliographicCitation	107th 춘계대한화학회	-
dc.citation.title	107th 춘계대한화학회	-
dc.citation.conferencePlace	KO	-

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