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dc.contributor.author정경윤-
dc.contributor.author김동현-
dc.contributor.author디키 수산토-
dc.contributor.author장원영-
dc.contributor.author조병원-
dc.contributor.author오시형-
dc.contributor.author윤여조-
dc.date.accessioned2024-01-12T22:30:35Z-
dc.date.available2024-01-12T22:30:35Z-
dc.date.issued2017-06-20-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/98099-
dc.title투과형 엑스선 회절 분석장치용 퍼니스 및 이를 이용한 투과형 엑스선 회절 분석장치-
dc.typePatent-
dc.date.registration2017-06-20-
dc.date.application2016-01-22-
dc.identifier.patentRegistrationNumber10-1750745-
dc.identifier.patentApplicationNumber2016-0007916-
dc.publisher.countryKO-
dc.type.iprs특허-
dc.contributor.assignee한국과학기술연구원-
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KIST Patent > 2016
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