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dc.contributor.authorChong Eu Gene-
dc.contributor.authorChun Yoon Soo-
dc.contributor.authorJo Kyoungchul-
dc.contributor.authorKim Seung Han-
dc.contributor.authorJung Da Woon-
dc.contributor.authorLee Sang Yeol-
dc.date.accessioned2024-01-12T23:06:05Z-
dc.date.available2024-01-12T23:06:05Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/99045-
dc.languageEnglish-
dc.titleTemperature Induced Instability of Passivation-Free Amorphous Indium Zinc Oxide (a-IZO) Thin Film Transistor-
dc.typeConference-
dc.description.journalClass1-
dc.identifier.bibliographicCitationIMID 2010, pp.149-
dc.citation.titleIMID 2010-
dc.citation.startPage149-
dc.citation.endPage149-
dc.citation.conferencePlaceKO-
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KIST Conference Paper > Others
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