DSpace at KISTKIST Patent2006

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dc.contributor.author양은경-
dc.contributor.author김정환-
dc.contributor.author김태송-
dc.contributor.author조한상-
dc.contributor.author강지윤-
dc.contributor.author신현준-
dc.contributor.author주병권-
dc.date.accessioned2024-01-12T23:31:45Z-
dc.date.available2024-01-12T23:31:45Z-
dc.date.issued2010-06-11-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/99314-
dc.title랩온어칩에서의 형광 편광 측정 방법-
dc.typePatent-
dc.date.registration2010-06-11-
dc.date.application2006-05-12-
dc.identifier.patentRegistrationNumber4527080-
dc.identifier.patentApplicationNumber2006-134551-
dc.publisher.countryJA-
dc.type.iprs특허-
dc.contributor.assignee한국과학기술연구원-
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KIST Patent > 2006
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