DSpace at KISTKIST Conference PaperOthers

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dc.contributor.authorLIM, WEON CHEOL-
dc.contributor.authorLee Ji-hye-
dc.contributor.authorLEE, YEON HEE-
dc.date.accessioned2024-01-12T23:34:39Z-
dc.date.available2024-01-12T23:34:39Z-
dc.date.created2021-09-29-
dc.identifier.urihttps://pubs.kist.re.kr/handle/201004/99512-
dc.languageEnglish-
dc.subjectquantitative-
dc.subjectdepth profiling-
dc.subjectdynamic SIMS-
dc.subjectthin layer-
dc.subjectFe/Ni-
dc.titleA comparison of quantitative analysis for various matrix containing Fe/Ni by depth profiling of dynamic SIMS-
dc.typeConference-
dc.description.journalClass2-
dc.identifier.bibliographicCitation대한화학회 학술발표회(춘계)-
dc.citation.title대한화학회 학술발표회(춘계)-
dc.citation.conferencePlaceKO-
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