- | Sequence relation and qualitative analysis of various inks using TOF-SIMS | Lee Ji-hye; LEE, YEON HEE; 김강진 |
- | SIMS Depth profiling of PS-PPrMA diblock coplymers | Lee Ji-hye; K. Kim; LEE, YEON HEE |
- | Surface Analysis and Depth Profiling of Polymers by TOF-SIMS | LEE, YEON HEE; Lee Ji-hye; 김선희; Kang Minhwa |
- | Surface Analysis of Diblock Copolymer Films by TOF-SIMS in Combination with AFM | Lee Ji-hye; 김선희; 강희경; LEE, KANG BONG; LEE, YEON HEE |
- | Surface Analysis of Diblock Copolymer Films using SIMS and AFM | Lee Ji-hye; Minhwa Kang; Kang-Jin Kim; LEE, YEON HEE |
- | Surface analysis of organic dye materials using Time-of-Flight Secondary Ion Mass Spectrometry | Lee Ji-hye; Chiwoo Lee; LEE, YEON HEE |
- | Surface and Interface Modification of Polymeric Materials by Various Plasma Techniques | Lee Ji-hye; LEE, YEON HEE |
- | Surface Characterization of Plasma Polymerized Fluorocarbon Thin Films | Kim Young-soo; Lee Ji-hye; LEE, YEON HEE |
- | Surface Modification of Fluorocarbon Thin Films Deposited by Pulsed-Plasma | Lee Ji-hye; Kim Kang-Jin; LEE, YEON HEE |
- | TOF-SIMS Analysis of fabrics with natural dyes and synthetic dyes | Lee Ji-hye; LEE, YEON HEE |
- | TOF-SIMS and XPS analysis of ancient and forensic materials | LEE, YEON HEE; Lee Ji-hye; 함승욱; LEE, KANG BONG; 김강진 |
- | TOF-SIMS Study of red sealing-inks on paper and its forensic applications | Lee Ji-hye; Chiwoo Lee; LEE, KANG BONG; LEE, YEON HEE |
- | TOF-SIMS study of sequence relation and qualitative analysis for various inks | Lee Ji-hye; LIM, WEON CHEOL; 김강진; LEE, YEON HEE |
- | Volume Measurement of Breast Cancer in Magnetic Resonance Image Using Active Contours Segmentation | Kang Minhwa; Lee Ji-hye; LEE, YEON HEE |
- | (Undefined) | Lee Ji-hye; LEE, YEON HEE; 함승욱; 김규호; 김강진 |