| 2011-01 | Depth profiling of lamella-phase diblock copolymers using SIMS | Lee, Yeonhee; Lee, Jihye; Lim, Weon Cheol; Shin, Kwanwoo; Kim, Kang-Jin |
| - | Development of the microprobe analytical method of TOF-SIMS with derivatization reaction for PSII-treated polymer surfaces | KWON MOON HEE; HAN, SEUNG HEE; LEE, YEON HEE; Hae-Dong Kim |
| 1998-04-15 | Enhancement of selective chemical vapor deposition of copper by nitrogen plasma pretreatment | Kim, YS; Kim, DJ; Kwak, SK; Kim, EK; Min, SK; Jung, DG |
| 2021-07 | Forensic Characterization of Lipsticks Using Time-of-Flight Secondary Ion Mass Spectrometry | Lee, Jihye; Lee, Yeonhee |
| - | Identification of automotive paints using time-of-flight secondary ion mass spectrometry | LEE YEON HEE; HAN SEUNG HEE; 윤정현; KIM YOUNG MAN; 손성건; 박성우 |
| - | Identification of automotive paints using time-of-flight secondary ion mass spectrometry | LEE YEON HEE; HAN SEUNG HEE; 윤정현; KIM YOUNG MAN; 손성건; 박성우 |
| 2015-11 | Identification of Natural Dyes in Ancient Textiles by Time-of-Flight Secondary Ion Mass Spectrometry and Surface-Enhanced Raman Spectroscopy | Lee, Jihye; Kim, Min Jung; van Elslande, Elsa; Walter, Philippe; Lee, Yeonhee |
| - | Identification of sequence between overlapping signatures of different pen inks by TOF-SIMS imaging | 김선희; Lee Ji-hye; LIM, WEON CHEOL; LEE, YEON HEE |
| - | Investigation of Microphase Separation of Diblock Copolymers by TOF-SIMS and AFM | LEE, YEON HEE; 이지혜; Minhwa Kang; Kwanwoo Shin |
| - | Investigation of natural dyes and ancient textiles from Korea using TOF-SIMS | LEE, YEON HEE; Lee Ji-hye; Youngsoo, Kim; Kang-Jin Kim; Seungwook Ham |
| 2008-12-15 | Investigation of natural dyes and ancient textiles from korea using TOF-SIMS | Lee, Yeonhee; Lee, Jihye; Kim, Youngsoo; Choi, Seokchan; Ham, Seung Wook; Kim, Kang-Jin |
| - | Qualitative analysis of the red stamping inks in the document using TOF-SIMS | Cho Youn Jeang; Lee Ji-hye; 윤정현; LEE, YEON HEE |
| - | Qualitative analysis of the red stamping inks on paper using TOF-SIMS | Lee Ji-hye; Chiwoo Lee; LEE, YEON HEE |
| - | Quantitative Analysis of Metal Alloy by TOF-SIMS Depth Profiling | LIM, WEON CHEOL; Lee Ji-hye; LEE, YEON HEE |
| 2006-07-30 | Selective detection of organic compounds on modified polymer surfaces using TOF-SIMS in combination with derivatization | Kwon, Moonhee; Lee, Yeonhee; Kim, Youngsoo; Han, Seunghee; Kim, Haidong |
| 2003-01-15 | Structural characterization of various ionomers by time-of-flight secondary ion mass spectrometry | Lee, Y; Han, S; Kwon, MH; Lim, H; Kim, YS; Chun, H; Kim, JS |
| 1999-01 | Studies of polystyrenes using time-of-flight secondary ion mass spectrometry | 이연희; 한승희; 윤정현; 임현의; 조정희 |
| 1997-10 | Surface analysis by time-of-flight secondary ion mass spectrometry(TOF-SIMS) | 이연희; 한승희 |
| - | Surface analysis for polymeric materials using TOF-SIMS. | LEE YEON HEE; HAN SEUNG HEE; 윤정현; LIM HYUN EUI; SUH MOO JIN |
| 2014-11 | Surface analysis of diblock copolymer films by TOF-SIMS in combination with AFM | Lee, Jihye; Shin, Kwanwoo; Lee, Kang-Bong; Lee, Yeonhee |
| 2002-08 | Surface analysis of polymers electrically improved by plasma-source ion-implantation | Lee, Y; Han, S; Lim, H; Kim, Y; Kim, H |
| 2000-11 | Surface characterization of ion beam-treated polymers | 이연희; 한승희; 임현의; Hyesun Jung; 조정희; 김영우 |
| 2001-08 | Surface characterization of polymers modified by keV and MeV ion beams | Lee, Y; Han, S; Lim, H; Jung, H; Cho, J; Kim, Y |
| - | Surface modification of polymers using plasma source ion implantation. | LEE YEON HEE; HAN SEUNG HEE; Lee junghye; 윤정현 |
| - | Synthesis and characterization of functionalized Si nanoparticle as co-sensitizer for dye-sensitized solar cells application | Youngsoo, Kim; 김창호; 이태경; LEE, YEON HEE; 김강진 |
| 2016-05 | Time-of-flight secondary ion mass spectrometry as a tool for evaluating the plasma-induced hydrogenation of graphene | Wallace, Joshua S.; Quinn, Austin; Gardella, Joseph A., Jr.; Hu, Jing; Kong, Eric Siu-Wai; Joh, Han-Ik |
| 2003-12 | Time-of-Flight Secondary Ion Mass Spectrometry for Surface Analysis | 이연희 |
| - | Time-of-flight secondary ion mass spectrometry of substituted polystyrenes. | LEE YEON HEE; HAN SEUNG HEE |
| - | TOF-SIMS Analysis of fabrics with natural dyes and synthetic dyes | Lee Ji-hye; LEE, YEON HEE |
| - | TOF-SIMS and XPS analysis of ancient and forensic materials | LEE, YEON HEE; Lee Ji-hye; 함승욱; LEE, KANG BONG; 김강진 |
