- | Qualitative analysis of the red stamping inks in the document using TOF-SIMS | Cho Youn Jeang; Lee Ji-hye; 윤정현; LEE, YEON HEE |
- | Qualitative analysis of the red stamping inks on paper using TOF-SIMS | Lee Ji-hye; Chiwoo Lee; LEE, YEON HEE |
- | Quantitative Analysis of Metal Alloy by TOF-SIMS Depth Profiling | LIM, WEON CHEOL; Lee Ji-hye; LEE, YEON HEE |
2006-07-30 | Selective detection of organic compounds on modified polymer surfaces using TOF-SIMS in combination with derivatization | Kwon, Moonhee; Lee, Yeonhee; Kim, Youngsoo; Han, Seunghee; Kim, Haidong |
2003-01-15 | Structural characterization of various ionomers by time-of-flight secondary ion mass spectrometry | Lee, Y; Han, S; Kwon, MH; Lim, H; Kim, YS; Chun, H; Kim, JS |
1999-01 | Studies of polystyrenes using time-of-flight secondary ion mass spectrometry | 이연희; 한승희; 윤정현; 임현의; 조정희 |
1997-10 | Surface analysis by time-of-flight secondary ion mass spectrometry(TOF-SIMS) | 이연희; 한승희 |
- | Surface analysis for polymeric materials using TOF-SIMS. | LEE YEON HEE; HAN SEUNG HEE; 윤정현; LIM HYUN EUI; SUH MOO JIN |
2014-11 | Surface analysis of diblock copolymer films by TOF-SIMS in combination with AFM | Lee, Jihye; Shin, Kwanwoo; Lee, Kang-Bong; Lee, Yeonhee |
2002-08 | Surface analysis of polymers electrically improved by plasma-source ion-implantation | Lee, Y; Han, S; Lim, H; Kim, Y; Kim, H |
2000-11 | Surface characterization of ion beam-treated polymers | 이연희; 한승희; 임현의; Hyesun Jung; 조정희; 김영우 |
2001-08 | Surface characterization of polymers modified by keV and MeV ion beams | Lee, Y; Han, S; Lim, H; Jung, H; Cho, J; Kim, Y |
- | Surface modification of polymers using plasma source ion implantation. | LEE YEON HEE; HAN SEUNG HEE; Lee junghye; 윤정현 |
- | Synthesis and characterization of functionalized Si nanoparticle as co-sensitizer for dye-sensitized solar cells application | Youngsoo, Kim; 김창호; 이태경; LEE, YEON HEE; 김강진 |
2016-05 | Time-of-flight secondary ion mass spectrometry as a tool for evaluating the plasma-induced hydrogenation of graphene | Wallace, Joshua S.; Quinn, Austin; Gardella, Joseph A., Jr.; Hu, Jing; Kong, Eric Siu-Wai; Joh, Han-Ik |
2003-12 | Time-of-Flight Secondary Ion Mass Spectrometry for Surface Analysis | 이연희 |
- | Time-of-flight secondary ion mass spectrometry of substituted polystyrenes. | LEE YEON HEE; HAN SEUNG HEE |
- | TOF-SIMS Analysis of fabrics with natural dyes and synthetic dyes | Lee Ji-hye; LEE, YEON HEE |
- | TOF-SIMS and XPS analysis of ancient and forensic materials | LEE, YEON HEE; Lee Ji-hye; 함승욱; LEE, KANG BONG; 김강진 |
2004-06-15 | TOF-SIMS study of modified polymer surfaces | Lee, Y; Han, S; Kwon, MH |
- | TOF-SIMS Study of red sealing-inks on paper and its forensic applications | Lee Ji-hye; Chiwoo Lee; LEE, KANG BONG; LEE, YEON HEE |
2008-12-15 | TOF-SIMS study of red sealing-inks on paper and its forensic applications | Lee, Jihye; Lee, Chiwoo; Lee, Kangbong; Lee, Yeonhee |
2016-11 | Wear Characteristics of Fluorocarbon Thin Films Deposited Using Inductively Coupled and Capacitively Coupled Plasma Methods | Cho, Youn-Jeong; Jang, Yun Jung; Han, Seunghee; Lee, Yeonhee |
2000-12 | 고분자 표면분석을 위한 비행시간형 이차이온 질량분석(TOF-SIMS) 기술 | 이연희 |
- | (Undefined) | 김선희; LIM, WEON CHEOL; LEE, YEON HEE |