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Issue DateTitleAuthor(s)
2016-08Fully subthreshold current-based characterization of interface traps and surface potential in III-V-on-insulator MOSFETsKim, Seong Kwang; Lee, Jungmin; Geum, Dae-Myeong; Park, Min-Su; Choi, Won Jun; Choi, Sung-Jin; Kim, Dae Hwan; Kim, Sanghyeon; Kim, Dong Myong
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