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Showing results 1 to 2 of 2

Issue DateTitleAuthor(s)
2020-01-01Channel thickness-dependent mobility degradation in planar junctionless transistorsJeon, Dae-Young
2018-07Extraction of Intrinsic Electrical Parameters in Partially Depleted MoS2 Field-Effect TransistorsJeon, Dae-Young; Lee, Dong Su; Lee, Seoung-Ki; Park, Min; Park, So Jeong; Kim, Gyu-Tae
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