Showing results 1 to 2 of 2
Issue Date | Title | Author(s) |
---|---|---|
2020-01-01 | Channel thickness-dependent mobility degradation in planar junctionless transistors | Jeon, Dae-Young |
2018-07 | Extraction of Intrinsic Electrical Parameters in Partially Depleted MoS2 Field-Effect Transistors | Jeon, Dae-Young; Lee, Dong Su; Lee, Seoung-Ki; Park, Min; Park, So Jeong; Kim, Gyu-Tae |