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Showing results 1 to 5 of 5

Issue DateTitleAuthor(s)
2014-02-25Dielectric function and critical points of AlP determined by spectroscopic ellipsometryHwang, S. Y.; Kim, T. J.; Jung, Y. W.; Barange, N. S.; Park, H. G.; Kim, J. Y.; Kang, Y. R.; Kim, Y. D.; Shin, S. H.; Song, J. D.; Liang, C. -T.; Chang, Y. -C.
2010-09-13Dielectric functions and interband transitions of In1-xAlxSb alloysYoon, J. J.; Kim, T. J.; Jung, Y. W.; Aspnes, D. E.; Kim, Y. D.; Kim, H. J.; Chang, Y. C.; Shin, S. H.; Song, J. D.
2011-09-01Dielectric response of AlP by in-situ ellipsometryJung, Y. W.; Byun, J. S.; Hwang, S. Y.; Kim, Y. D.; Shin, S. H.; Song, J. D.
2009-06-08Dielectric response of AlSb from 0.7 to 5.0 eV determined by in situ ellipsometryJung, Y. W.; Ghong, T. H.; Byun, J. S.; Kim, Y. D.; Kim, H. J.; Chang, Y. C.; Shin, S. H.; Song, J. D.
2009-05-01Ellipsometric analysis of porous anodized aluminum oxide filmsJung, Y. W.; Byun, J. S.; Woo, D. H.; Kim, Y. D.
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