Browsing byAuthor위영진

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Showing results 1 to 2 of 2

Issue DateTitleAuthor(s)
-Enhanced via reliability by Al-reflow for multi-level metallizationPark In Seon; 위영진; 이현덕; 박창수; 최길현; Jung Woo Sang; 이문용; 이문용
-The effect of H//2O from SOG on the reliability of submicron vias.Jung Woo Sang; 위영진; 최길현; 이상인; AHN SUNG TAE

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