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Showing results 1 to 2 of 2

Issue DateTitleAuthor(s)
-Atomic force microscopy study of GaN-buffer layers on SiC(0001) by MOCVD임동섭; Byun Dongjin; Kim Gyeung Ho; Nam Ok-Hyun; 최인훈; Park Dal keun; Kum Dong Wha
-Defects in GaN films on SiC(0001) with GaN buffer layers by MOCVD.Byun Dongjin; Kum Dong Wha; Kim Gyeung Ho; Park Dal keun; 임동섭; 최인훈
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