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Showing results 1 to 3 of 3

Issue DateTitleAuthor(s)
1997-09C-V characteristics of Pt/SrBi2Ta2O9/CeO2/Si structure for non-volatile memory devicesLee, H.N.; Shin, D.S.; Kim, Y.T.; Choh, S.H.
1998-07Characterization of the nitrided GaAs thin layers after rapid thermal annealing by using raman scatteringKoh, E.K.; Park, Y.J.; Kim, E.K.; Choh, S.H.
1999-11Effect of cerium silicate formation on the structural and electrical properties of Pt/SrBi2Ta2O9/CeO2/Si capacitorsLee, H.N.; Shin, D.S.; Kim, Y.T.; Choh, S.H.
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