Browsing byAuthorChung, MK

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Showing results 1 to 3 of 3

Issue DateTitleAuthor(s)
2000-09Determination of optical constants of thin films from measurements of reflectance and transmittanceBie, QS; Cheong, BK; Chung, MK; Lin, ZS; Lee, TS; Kim, WM; Kim, SG
2004-02-15Effect of the number of ECAP pass time on the electrochemical properties of 1050 Al alloysChung, MK; Choi, YS; Kim, JG; Kim, YM; Lee, JC
2000-11Mechanical and adhesion properties of Al/AlN multilayered thin filmsLee, JH; Kim, WM; Lee, TS; Chung, MK; Cheong, BK; Kim, SG

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