Showing results 1 to 3 of 3
Issue Date | Title | Author(s) |
---|---|---|
2000-09 | Determination of optical constants of thin films from measurements of reflectance and transmittance | Bie, QS; Cheong, BK; Chung, MK; Lin, ZS; Lee, TS; Kim, WM; Kim, SG |
2004-02-15 | Effect of the number of ECAP pass time on the electrochemical properties of 1050 Al alloys | Chung, MK; Choi, YS; Kim, JG; Kim, YM; Lee, JC |
2000-11 | Mechanical and adhesion properties of Al/AlN multilayered thin films | Lee, JH; Kim, WM; Lee, TS; Chung, MK; Cheong, BK; Kim, SG |