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Issue DateTitleAuthor(s)
-Investigation on the enhanced switching reliability of a non-volatile phase-change memory device with an oxidized TiN electrodeDae-Hwan Kang; Kim Inho; Jeung-hyun Jeong; CHEONG, BYUNG KI; Dong-Ho Ahn; Dongbok Lee; Hyun-Mi Kim; Ki-Bum Kim
1

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