Showing results 1 to 1 of 1
Issue Date | Title | Author(s) |
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- | Carrier lifetime in dielectric cap disordered GaAs/AlGaAs quantum well by SiN capping layer. | W. J. Choi; Lee Seok; D. Woo; Lee Jung Il; S. K. Kim; J. H. Chu; S. K. Yu; KANG KWANG NHAM; D. Kim; K. Cho |