Browsing byAuthorJ. H. Chu

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Issue DateTitleAuthor(s)
-Carrier lifetime in dielectric cap disordered GaAs/AlGaAs quantum well by SiN capping layer.W. J. Choi; Lee Seok; D. Woo; Lee Jung Il; S. K. Kim; J. H. Chu; S. K. Yu; KANG KWANG NHAM; D. Kim; K. Cho

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