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Carrier lifetime in dielectric cap disordered GaAs/AlGaAs quantum well by SiN capping layer.

Authors

W. J. Choi; Lee Seok; D. Woo; Lee Jung Il; S. K. Kim; J. H. Chu; S. K. Yu; KANG KWANG NHAM; D. Kim; K. Cho

Citation

CLEO/QELS '95, Baltimore, USA, pp.?

Keywords

quantum well disordering

URI

https://pubs.kist.re.kr/handle/201004/112004

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KIST Conference Paper > Others

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