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Issue DateTitleAuthor(s)
2025-08Comprehensive Understanding of Fatigue, Breakdown, and Recovery Mechanism by Thickness Scaling in Hf0.5Zr0.5O2/Ge MF(I)S Capacitors for Low Writing VoltagesJeong, Jai-Youn; Ko, Kyeol; Shin, Changhwan; Han, Jae-Hoon
2024-10Design Points of InGaAs MFMIS Tunnel FET for Large Memory Window and Stable Ferroelectric Memory OperationKo, Kyul; Ahn, Dae-Hwan; Jeong, Jai-Youn; Ju, Byeong-Kwon; Han, Jae-Hoon
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