1994-06-15 | 2-TEMPERATURE TECHNIQUE FOR PLASMA-ENHANCED CHEMICAL-VAPOR-DEPOSITION GROWTH OF SILICON-NITRIDE ON INP | HER, J; LIM, H; KIM, CH; HAN, IK; LEE, JI; KANG, KN; KIM, JE; PARK, HY |
1994-09-15 | COATING OF YTTRIA PRECURSOR ON ALN POWDER BY IN-SITU PRECIPITATION | KIM, WJ; MOON, YT; KIM, CH; KIM, DK; LEE, HW |
1987-06 | CONDITION MONITORING TECHNIQUES FOR AN INTERNAL-COMBUSTION ENGINE | KWON, OK; KONG, HS; KIM, CH; OH, PK |
1993-03 | CONSTANT CAPACITANCE TECHNIQUE TO STUDY ELECTRICAL INSTABILITIES IN INP MIS PROVIDED BY PECVD SILICON-NITRIDE | KIM, CH; KWON, SD; CHOE, BD; HAN, IK; LEE, JI; KANG, KN; PARK, HL; LIM, H |
1994-04-15 | EFFECT OF ULTRAVIOLET ILLUMINATION ON THE CHARGE TRAPPING BEHAVIOR IN SINX/INP METAL-INSULATOR-SEMICONDUCTOR STRUCTURE PROVIDED BY PLASMA-ENHANCED CHEMICAL-VAPOR-DEPOSITION | KIM, CH; HAN, IK; LEE, JI; KANG, KN; KWON, SD; CHOE, B; PARK, HL; HER, J; LIM, H |
1994-03 | ELECTRICAL-PROPERTIES OF RADIO-FREQUENCY MAGNETRON-SPUTTERED (BASR)TIO3 THIN-FILMS ON INDIUM TIN OXIDE-COATED GLASS SUBSTRATE | KIM, TS; KIM, CH; OH, MH |
1993-06 | INFLUENCES OF INDIUM TIN OXIDE LAYER ON THE PROPERTIES OF RF MAGNETRON-SPUTTERED (BASR)TIO3 THIN-FILMS ON INDIUM TIN OXIDE-COATED GLASS SUBSTRATE | KIM, TS; OH, MH; KIM, CH |
1992-10 | INTERFACE CONSTRAINTS IN INP MIS STRUCTURES | KIM, CH; CHOE, B; LIM, H; LEE, JI; KANG, KN |
1995-01 | LOCATION OF TB(III) IONS IN NA-Y ZEOLITE DETERMINED BY LUMINESCENCE SPECTROSCOPY | HONG, SB; SEO, JS; PYUN, CH; KIM, CH; UH, YS |
1995-08-10 | LUMINESCENCE STUDIES ON INTRAZEOLITIC MIGRATION OF TB(III) IONS BY THERMAL TREATMENTS .1. FAU-TYPE ZEOLITES | HONG, SB; SHIN, EW; MOON, SH; PYUN, CH; KIM, CH; UH, YS |
1995-08-10 | LUMINESCENCE STUDIES ON INTRAZEOLITIC MIGRATION OF TB(III) PENS BY THERMAL TREATMENTS .2. LTA-TYPE ZEOLITES | HONG, SB; SHIN, EW; MOON, SH; PYUN, CH; KIM, CH; UH, YS |
1986-01 | PHOTOCURABLE SYSTEM OF POLYTHIOL AND POLYPHOSPHAZENE-CONTAINING ALLYL GROUPS | AHN, KD; KIM, UY; KIM, CH |
1991-10-20 | STEREOCHEMICAL INDUCTION IN THE GENERATION OF 1-CHLORO-1-PHENYL-2-NEOPENTYLSILENE | YOO, BR; JUNG, IN; LEE, ME; KIM, CH |
1992-11-15 | STUDY OF CHARGE TRAPPING INSTABILITIES IN A SILICON-NITRIDE INDIUM-PHOSPHIDE METAL-INSULATOR-SEMICONDUCTOR STRUCTURE BY THE CONSTANT-CAPACITANCE METHOD | KIM, CH; CHOE, BD; LIM, H; HAN, IK; LEE, JI; KANG, KN |
1993-10 | STUDY ON THE LOW-FIELD CHARGE-TRAPPING PHENOMENA IN THE SILICON-NITRIDE INP STRUCTURE | KIM, CH; KWON, SD; CHOE, BD; HAN, IK; LEE, JI; KANG, KN; HER, J; LIM, H |
1994-05-20 | SYNTHESIS, CHARACTERIZATION AND STABILITY OF (IPRO)2SI=FE(CO)4.HMPA | LEE, ME; HAN, JS; KIM, CH |
1994-07 | TESTS RESULTS FOR ROTORDYNAMIC COEFFICIENTS OF ANTISWIRL SELF-INJECTION SEALS | KIM, CH; LEE, YB |
1994-10-01 | THE EFFECT OF BUFFER LAYER ON THE STRUCTURAL AND ELECTRICAL-PROPERTIES OF (BASR)TIO3 THIN-FILMS DEPOSITED ON INDIUM TIN OXIDE-COATED GLASS SUBSTRATE BY USING A RF MAGNETRON SPUTTERING METHOD | KIM, TS; KIM, CH; OH, MH |
1995-01-01 | THE THICKNESS DEPENDENCE OF (BA0.5SR0.5)TIO3 THIN-FILMS DEPOSITED ON INDIUM TIN OXIDE-COATED GLASS SUBSTRATE USING RF MAGNETRON SPUTTERING | KIM, TS; OH, MH; KIM, CH |