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Showing results 1 to 3 of 3

Issue DateTitleAuthor(s)
-Charge trapping instabilities in SiO2/InP MIS structures.KANG KWANG NHAM; Lee Jung Il; 최병두; KIM CHOONG HWAN; 임한조; Han Il Ki
-Electrical properties of SiNx/InP structure.KANG KWANG NHAM; Lee Jung Il; KIM CHOONG HWAN; 권상덕; 최병두; 임한조; Han Il Ki
-Schottky barrier enhancement of InGaAs with SiNx grown by PECVD.KANG KWANG NHAM; Lee Jung Il; KIM CHOONG HWAN; 박홍이; Han Il Ki
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